CTO Blog: Integrated Circuit Reliability Prediction Based on Physics-of-Failure Models in Conjunction with Field Study

Integrated Circuit Reliability Prediction Based on Physics-of-Failure Models in Conjunction with Field Study Microelectronics device reliability has been improving with every generation of technology whereas the density of the circuits continues to double approximately every 18 months. We studied field data gathered from a large fleet of mobile communications products that were deployed over a…