Introduction: Practical Reliability and Maintenance Engineering Symposium
The International PRM Symposium provides a forum for expert presenters from various industries, universities and governments to meet with circuit board designers, EDA users, mechanical engineers and reliability practitioners, in order to study and understand the common causes of failures in electronics and mechanics. It also provides a comprehensive review of the tools and techniques used to identify those potential failures in order to best handle real-world challenges.
The symposium will take place in several locations around the world. Various experienced practitioners will present the latest innovative methods. For upcoming events, click on the Previews seminar icon.
Presenters include various industry experts.
The Symposium offers in-depth tutorials on key PCB reliability and related topics. Tutorial instructors are experts in the principles, theory and applications of the relevant analysis methods/techniques, with extensive experience in providing training and analysis for industry applications. Topics include:
- Design for reliability – process and best practices
- Developing stress and derating analysis methods
- Improving the reliability of electronics systems using advanced analysis
- New prediction models
- Mechanical reliability of PCBs
- Thermal aspects in PCB layout and design
- Mechanical parts life prediction
- The new 217G, FIDES, Sn-29500, IEC62380 and Telcordia Ver 3 models
- Electrical stress derating criteria
- Mechanical tress for PCB
The Symposium is organized by the PRM-Symposium Organization team. You are welcome to join the organization.
For registration information please email email@example.com.
Reliability engineering is a key factor in improving product robustness, but is held back by traditional methods for product analysis.
This symposium will expose RAMS engineers to new concepts.
The main challenges are:
- Having predicted reliability resemble field reliability
- Automated data retrieval from CAD and EDA tools
- Concurrent usage
- Improving design rather than numbers