July 3, 2013, Herzliya, Israel, Reliability Design and Design for Reliability: Design Error Detection and Analysis in Electronic Cards
BQR Ltd & The Union of Advanced Technology Users
In Integrated Hi-Tech Systems Present:
Reliability Design and Design for Reliability:
Design Error Detection and Analysis in Electronic Cards
Date: July 3, 2013
Venue: Herzliya, ISRAEL
Sessions
13:45-14:00
Registration
14:00-15:30
fiXtress – Product reliability tool in early R&D stages. Yizhak Bot
15:30-15:45
Break
15:45-16:45
User experience in Elisra company: Implementing fiXress in the development of new cards. Yisrael Weinstock
16:45-17:00
Integrating fiXress in an innovative development of error rate prediction in chips using the Physics of Failures method. Joseph Bernstein
17:00-17:30
Wrap Up
Seminar Overview
The complexity level of PCBs is gradually increasing, especially following the introduction of components with 1000+ pins. On the other hand, development cycles and time to market are being shortened, and R&D costs are being reduced.
These constraints have brought forth the need for simulation tools, which enable releasing reliable, robust products, as well as meeting planned stress levels within short timespans, and activating them in the design stage, before the first prototype is manufactured.
The presentation will present the fiXtress, an innovative tool enabling analysis and detection of design faults, along with meeting product reliability objectives, all performed automatically.
The method includes building a model for the different stages in the development cycle, and models for components which will undergo an integration process for a virtual PCB. The virtual PCB will be simulated by Netlist, and by activating a set of rules, will detect components containing planning errors, which include deviations in electric stress, and reduce the PCB’s power consumption.
Furthermore, an innovative development will be presented, for prediction of the failure rate in FPGAs, which are used in PCBs.
