As product designs becomes more complex, the testing complexity increases as well. Therefore, testing electronic systems and mechanical components requires built-in-tests (BIT). Monitoring these tests in an organized and structured manner using Fault Detection and Isolation (FDI) techniques is also required.
Testability Analysis is a standard method for calculating the coverage and isolation of Built In Test (BIT) circuits. This is vital for ensuring that critical failure-modes are covered and can be quickly identified. Testability Analysis provides insights into the system’s self-diagnostic capabilities.
BQR’s Testability Analysis software can help you to quickly design BITs and ATE (Automatic Test Equipment) for your system, providing high coverage of failure modes, and quick fault isolation.
Compliance to Standards
BQR’s Testability Analysis software complies with the following standards:
Steps for conducting a Testability Analysis
- Use the BQR FMECA project
- Define list of tests
- Define which failure modes are covered by each test
- Define list of BITs
- For each BIT, assign relevant tests
- Define Operator and Maintenance messages for each test (optional)
- The software calculates BIT coverage and isolation
- Coverage and isolation
- Recommendations for improvement
- All reports can be customized
- All reports can be saved as Excel, HTML or Word files
- BIT coverage
- Isolation level
- False alarms
- Import and Export bit and test lists
- Detailed help and wizard for beginners and advanced users